John Lataire was born in Brussels, Belgium, in 1983. He received the Electrical Engineer degree in electronics and information processing and the Ph.D. degree in engineering sciences (Doctor in de Ingenieurswetenschappen) from the Vrije Universiteit Brussel, Brussels, in 2006 and 2011, respectively.

From October 2007 to October 2011, he was on a Ph.D. fellowship from the Research Foundation—Flanders (FWO). Since August 2006, he has been working as a researcher with the Department ELEC-VUB, Brussels.

Dr. Lataire is the coauthor of more than 40 articles in refereed international journals. He received the 2008 IOP outstanding paper award (best paper in Measurement Science & Technology), the Best Junior Presentation Award 2010 at the 29th Benelux Meeting on Systems and Control, was the co-recipient of the 2014 Andy Chi award (best paper in IEEE Trans. on Instrumentation and Measurement), and was the recipient of the 2016 J. Barry Oakes Advancement Award (from the IEEE Instrumentation and Measurement society).